MultiMode V AFM was designed to enable measurements of small samples, such as polymers and electrochemical materials. The product now features industry-leading high-speed data capture (50 MHz), increased thermal tune capabilities and high pixel density images which allow observation of large structures and small features in the same image. The system performs the full range of AFM and scanning tunneling microscopy (STM) techniques to measure surface characteristics like topography, elasticity, friction, adhesion, and magnetic/electrical fields. The short mechanical path length between probe tip and sample enables very fast scan rates with utmost precision.


New NanoScope V controller

Offers high-speed data capture (50MHz)

Captures up to eight images simultaneously

High-pixel-density images (5000 x 5000)

Operational Modes

  • Contact Mode

  • Tapping Mode

  • Multimode PeakForce Quantiative Nanomechanical Mapping (MM-PFQNM)

  • Lateral Force Microscopy

  • Scanning Tunneling Microscopy

  • Electrostatic Force Microscopy

Sample requirements

AFM samples are attached to 1.5 cm metallic disks. Samples should not exceed the size of the disk and must be less than 8 mm thick. The maximum scan scanning size is 10 microns x 10 microns and the maximum height is 2.5 microns.

Examples/Application areas

Zhu, C., Monti, S. & Mathew, A. P. Cellulose Nanofiber–Graphene Oxide Biohybrids: Disclosing the Self-Assembly and Copper-Ion Adsorption Using Advanced Microscopy and ReaxFF Simulations. ACS Nano 12, 7028–7038 (2018).

Link of booking


New non experienced person who wants to get training of AFM should read theory about AFM in advance and pass a quiz to be quantified be being given hands on training

Tutorials can be found at below link

Or via Bruker online training manual