Themis Z at EMC, Stockholm University

The flagship is the aberration-corrected transmission electron microscope Thermo Fisher Scientific™ Themis Z. It is equipped with probe and image aberration correctors, providing excellent imaging capability at atomic resolution in both high-resolution STEM (scanning transmission electron microscopy) and TEM. The microscope currently can be operated at accelerating voltages of 60 kV, 200 kV and 300 kV. Themis Z at EMC delivers spatial resolution ≤ 60 pm in both TEM and STEM at 300 kV. A Gatan Oneview camera with in-situ option is present for fast acquisition of high quality TEM images (max 300 frames per second). A range of STEM detectors are present for collecting signals simultaneously to form different images. A four quadrant Super-X EDX detector enables high analytical capability down to atomic scale. A Gatan imaging filter (Quantum ER) for electron energy loss spectrometer (EELS) and energy-filtered imaging attached to Themis Z provides fast spectrum (1000/sec) acquisition and it is capable to collect spectra in both low and high-energy regimes simultaneously. The field-emission electron gun is equipped with a monochromator; the use of such an electron probe in analytical studies with EELS provide high energy resolution (<0.2 eV) providing the possibility to measure band-gap of materials, surface plasmons, valence band structures, chemical bond information etc. at the atomic scale. Automated tomography acquisitions in TEM, STEM and STEM-EDX are also possible. A number of sample holders are present for imaging, analytical studies, tomography and in-situ heating/cooling experiments.

Themis Z (TEM/STEM - specifications)

JEOL JEM-3010
Themis Z
  • Schottky-type field emission gun XFEG with Monochromator

  • Acc. Voltage: 300 kV (60 kV, 200 kV)

  • Probe and Image Cs correctors

  • Resolution: 300 kV: ≤ 60 pm, 200kV: ≤ 70 pm, 60 kV: ≤100 pm

  • CL apertures C2: 150, 100, 70 and 50 µm

  • SA apertures: 800, 200, 40 and 10 µm

Options: 

  • Gatan Oneview camera with In-situ (4kx4k, ≥300 fps at 512x512)
  • SuperX EDS detector (Resolution ≤136 eV, Detectable Z≥B)
  • Gatan Quantum 965 ER (Energy spread: 0.25 eV at 300 kV, CCD for image filter: 2kx2k)
  • STEM Detectors: FEI BF, ADF (DPC), ABF and HAADF; Gatan BF and DF

Sample holders:

  • Single tilt (+-35 degrees)
  • Double tilt (+-35/+-30 degrees)
  • Double tilt low-background (+-35/+-30 degrees)
  • Double tilt for air-sensitive (+-30/+-30 degrees)
  • High tilt for tomography (+-70 degrees)
  • Dual axis tomography (+-70 degrees)
  • Double tilt cooling (+-30/+-30 degrees)
  • Double tilt heating (+-30/+-30 degrees, 1000 degree Celsius)

 

Jeol JEM 2100 microscopes at EMC

EMC has two 200 kV workhorse instruments. The instruments were acquired in 2007 but have been upgraded with modern imaging detectors allowing advanced imagining and diffraction techniques, which are very important for the development of modern world leading electron crystallography techniques.

JEOL JEM-2100F (TEM/STEM) specifications

  • Schottky-type field emission gun
  • Ultra Resolution Polepieces (URP): (f=1.9mm, Cs=0.5mm, Cc=1.1mm)
  • Acc. Voltage: 200 kV (80, 120, 160kV)
  • Resolution: Point=1.9Å, Lattice=1.0Å, Information limit=1.3Å
  • CL apertures: 1, 10, 40, 100, 200µm
  • SA apertures: 1, 2, 10, 20, 50, 100µm
  • Magnification: 50x-1,500,000x
JEOL JEM-2100F (TEM/STEM)
JEOL JEM-2100F (TEM/STEM)

Options:

CCD (Gatan Ultrascan 1000)
EDS (Resolution=138eV, Detectable Z≥B)
Gatan GIF Tridiem (Resolution=0.7eV, CCD for image filter: 2kx2k)
STEM BF (Lattice resolution 2Å)
STEM HAADF (Probe size 1.36Å)
BEI detector

Sample holders:

Single tilt (+-25 degrees)
Double tilt (+-25/+-25 degrees)
Double tilt low-background (+-25/+-25 degrees)
Single tilt for air-sensitive (+-25 degrees)
High tilt for tomography (+-45 degrees)
Single tilt cryo-transfer (Gatan CT3500; +-25 degrees)
Light-import holder

 

 

JEOL JEM-2100 (TEM/STEM)

  • LaB6 filament
  • High Tilt Polepieces (HTP): (f=2.7mm, Cs=1.4mm, Cc=1.8mm)
  • Acc. Voltage: 200 kV
  • Resolution: Point=2.5Å, Lattice=1.4Å
  • CL apertures: 10, 50, 70, 150µm
  • SA apertures: 10, 20, 50, 100µm
  • Magnification: 50x-1,200,000x

Options:

JEOL JEM-2100 (TEM/STEM)
JEOL JEM-2100 (TEM/STEM)

Upper mount CCD (Gatan ES500W Erlangshen)
Bottom mount CCD (Gatan SC1000 ORIUS)
EDS (Resolution=138eV, Detectable Z≥B)
STEM Dark-field detector
Precession diffraction device (JEOL & NanoMEGAS)
Beam blanking device (JEOL)
BEI detector

Sample holders:

Single tilt (+-42 degrees)
Double tilt (+-42/+-30 degrees)
Double tilt low-background (+-42/+-30 degrees)
Single tilt for air-sensitive (+-30 degrees)
Ultrahigh tilt for tomography (+-80 degrees)
Dual-axis tomography holder (+-70 degrees)
Single tilt cryo-transfer (Gatan CT3500; +-42 degrees)
Double tilt liquid nitrogen cooling (Gatan CHDT3504; +-42/+-30 degrees)

Sample holders for the JEOL JEM instruments (OBS: the detailed operational conditions are microscope dependent)

  • Single tilt (+-25 degrees)

  • Double tilt (+-25/+-25 degrees)

  • Double tilt low-background (+-25/+-25 degrees)

  • Single tilt for air-sensitive (+-25 degrees)

  • High tilt for tomography (+-45 degrees)

  • Single tilt cryo-transfer (Gatan CT3500; +-25 degrees)

  • Light-import holder

 

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