JEOL JEM-3010

JEOL JEM-3010
JEOL JEM-3010
  • LaB6 filament
  • Ultra Resolution Polepieces (URP) (Cs=0.6mm)
  • Acc. Voltage: 300 kV
  • Point resolution = 1.7 Å

Sample holders:

Double tilt (+-25/+-25 degrees)
Single tilt (+-25 degrees)

Options: 

CMOS camera (TVIPS F-216)
Precession electron diffraction unit (NanoMEGAS)

 

JEOL JEM-2100F (TEM/STEM)

  • Schottky-type field emission gun
  • Ultra Resolution Polepieces (URP): (f=1.9mm, Cs=0.5mm, Cc=1.1mm)
  • Acc. Voltage: 200 kV (80, 120, 160kV)
  • Resolution: Point=1.9Å, Lattice=1.0Å, Information limit=1.3Å
  • CL apertures: 1, 10, 40, 100, 200µm
  • SA apertures: 1, 2, 10, 20, 50, 100µm
  • Magnification: 50x-1,500,000x
JEOL JEM-2100F (TEM/STEM)
JEOL JEM-2100F (TEM/STEM)

Sample holders:

Single tilt (+-25 degrees)
Double tilt (+-25/+-25 degrees)
Double tilt low-background (+-25/+-25 degrees)
Single tilt for air-sensitive (+-25 degrees)
High tilt for tomography (+-45 degrees)
Single tilt cryo-transfer (Gatan CT3500; +-25 degrees)
Light-import holder

Options:

CCD (Gatan Ultrascan 1000)
EDS (Resolution=138eV, Detectable Z≥B)
Gatan GIF Tridiem (Resolution=0.7eV, CCD for image filter: 2kx2k)
STEM BF (Lattice resolution 2Å)
STEM HAADF (Probe size 1.36Å)
BEI detector

 

JEOL JEM-2100 (TEM/STEM)

  • LaB6 filament
  • High Tilt Polepieces (HTP): (f=2.7mm, Cs=1.4mm, Cc=1.8mm)
  • Acc. Voltage: 200 kV
  • Resolution: Point=2.5Å, Lattice=1.4Å
  • CL apertures: 10, 50, 70, 150µm
  • SA apertures: 10, 20, 50, 100µm
  • Magnification: 50x-1,200,000x

Sample holders:

JEOL JEM-2100 (TEM/STEM)
JEOL JEM-2100 (TEM/STEM)

Single tilt (+-42 degrees)
Double tilt (+-42/+-30 degrees)
Double tilt low-background (+-42/+-30 degrees)
Single tilt for air-sensitive (+-30 degrees)
Ultrahigh tilt for tomography (+-80 degrees)
Dual-axis tomography holder (+-70 degrees)
Single tilt cryo-transfer (Gatan CT3500; +-42 degrees)
Double tilt liquid nitrogen cooling (Gatan CHDT3504; +-42/+-30 degrees)

Options:

Upper mount CCD (Gatan ES500W Erlangshen)
Bottom mount CCD (Gatan SC1000 ORIUS)
EDS (Resolution=138eV, Detectable Z≥B)
STEM Dark-field detector
Precession diffraction device (JEOL & NanoMEGAS)
Beam blanking device (JEOL)
BEI detector

 

JEOL JEM-2000FXII

  • LaB6 filament
  • Polepieces: AHP20L (f=4.1mm, Cs=3.4mm, Cc=3.1mm)
  • Acc. Voltage: 200 kV
  • Resolution: Point=3.1Å, Lattice=1.4Å

Sample holders:

Double tilt (+-42/+-40 degrees)
Single tilt double specimen (+-42 degrees)

Options:

CCD (Olympus KeenView)
Precession diffraction device
EDS (Thermo Scientific NORAN System 7; Resolution=134eV, Detectable Z≥Be)

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